Search results for "Si nanocrystal"

showing 5 items of 5 documents

Silicon-based light-emitting devices: Properties and applications of crystalline, amorphous and er-doped nanoclusters

2006

In this paper, we summarize the results of an extensive investigation on the properties of MOS-type light-emitting devices based on silicon nanostructures. The performances of crystalline, amorphous, and Er-doped Si nanostructures are presented and compared. We show that all devices are extremely stable and robust, resulting in an intense room temperature electroluminescence (EL) at around 900 nm or at 1.54 μm. Amorphous nanoclusters are more conductive than the crystalline counterpart. In contrast, nonradiative processes seem to be more efficient for amorphous clusters resulting in a lower quantum efficiency. Erbium doping results in the presence of an intense EL at 1.54 μm with a concomit…

Materials scienceSiliconElectroluminescent devicechemistry.chemical_elementNanocrystalQUANTUM DOTSElectroluminescenceSettore ING-INF/01 - ElettronicaSettore FIS/03 - Fisica Della MateriaNanoclustersErbiumIntegrated optoelectronicElectroluminescence (EL)Light-emitting deviceOptical interconnectionElectrical and Electronic Engineeringbusiness.industryDopingOPTICAL-PROPERTIESAtomic and Molecular Physics and OpticsAmorphous solid1.54 MU-MchemistryNanocrystalOptoelectronicsQuantum efficiencySI NANOCRYSTALSENERGY-TRANSFERbusinessErbium
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Luminescent silicon nanocrystals produced by near-infrared nanosecond pulsed laser ablation in water

2014

Abstract We report the investigation of luminescent nanoparticles produced by ns pulsed Nd:YAG laser ablation of silicon in water. Combined characterization by AFM and IR techniques proves that these nanoparticles have a mean size of ∼3 nm and a core–shell structure consisting of a Si-nanocrystal surrounded by an oxide layer. Time resolved luminescence spectra evidence visible and UV emissions; a band around 1.9 eV originates from Si-nanocrystals, while two bands centered at 2.7 eV and 4.4 eV are associated with oxygen deficient centers in the SiO 2 shell.

Materials scienceSiliconCore–shellmedicine.medical_treatmentOxideAnalytical chemistryGeneral Physics and Astronomychemistry.chemical_elementNanoparticleSpectral lineAtomic force microscopychemistry.chemical_compoundmedicineSi nanocrystalLaser ablationLaser ablation;Si nanocrystal;Silica;Core–shell;Time-resolved luminescence;Atomic force microscopy;Micro-Raman;IR absorptionNear-infrared spectroscopyTime-resolved luminescenceSilicaSurfaces and InterfacesGeneral ChemistryCondensed Matter PhysicsAblationLaser ablationSurfaces Coatings and FilmsMicro-RamanchemistryLuminescenceIR absorption
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Carrier-induced quenching processes on the erbium luminescence in silicon nanocluster devices

2006

The luminescence-quenching processes limiting quantum efficiency in Er-doped silicon nanocluster light-emitting devices are investigated and identified. It is found that carrier injection, while needed to excite Er ions through electron-hole recombination, at the same time produces an efficient nonradiative Auger deexcitation with trapped carriers. This phenomenon is studied in detail and, on the basis of its understanding, we propose device structures in which sequential injection of electrons and holes can improve quantum efficiency by avoiding Auger processes. © 2006 The American Physical Society.

Materials scienceSiliconAstrophysics::High Energy Astrophysical Phenomenalight-emitting deviceschemistry.chemical_elementElectronElectroluminescenceSettore ING-INF/01 - ElettronicaSettore FIS/03 - Fisica Della MateriaAugerErbiumCondensed Matter::Materials ScienceELECTROLUMINESCENCEPhysics::Atomic and Molecular ClustersPhysics::Atomic PhysicsQuenchingOPTICAL GAINbusiness.industryCondensed Matter PhysicsElectronic Optical and Magnetic Materials1.54 MU-MchemistryOptoelectronicsQuantum efficiencySI NANOCRYSTALSENERGY-TRANSFERLuminescencebusinessPhysical Review B
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Light absorption in silicon quantum dots embedded in silica

2009

The photon absorption in Si quantum dots (QDs) embedded in SiO2 has been systematically investigated by varying several parameters of the QD synthesis. Plasma-enhanced chemical vapor deposition (PECVD) or magnetron cosputtering (MS) have been used to deposit, upon quartz substrates, single layer, or multilayer structures of Si-rich- SiO2 (SRO) with different Si content (43-46 at. %). SRO samples have been annealed for 1 h in the 450-1250 °C range and characterized by optical absorption measurements, photoluminescence analysis, Rutherford backscattering spectrometry and x-ray Photoelectron Spectroscopy. After annealing up to 900 °C SRO films grown by MS show a higher absorption coefficient a…

SOLAR-CELLSPhotoluminescenceMaterials scienceEFFICIENCYSiliconAnalytical chemistryGeneral Physics and Astronomychemistry.chemical_elementChemical vapor depositionOPTICAL-PROPERTIESRutherford backscattering spectrometryFILMSSettore ING-INF/01 - Elettronica3RD-GENERATION PHOTOVOLTAICSSettore FIS/03 - Fisica Della MateriaMULTIPLE EXCITON GENERATIONchemistryX-ray photoelectron spectroscopyPlasma-enhanced chemical vapor depositionQuantum dotRAY PHOTOELECTRON-SPECTROSCOPYLUMINESCENCESI NANOCRYSTALSCOEFFICIENTAbsorption (electromagnetic radiation)
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Quantum confinement effects observed by the photoluminescence of SiOx/SiO2 multilayers

2012

Spectral and decay features related to the red emission from Si nanocrystals were investigated by time-resolved photoluminescence spectra carried out on SiOx/SiO2 nanosized multilayers. On decreasing the SiOx thickness from 8.4 nm to 2.2 nm this luminescence band exhibits a blue-shift from 1.65 eV to 1.75 eV and its lifetime increases from 12μs to 17 μs. These results are discussed on the basis of previous models proposed in literature and agree with quantum confinement effects arising from differently sized Si nanocrystals in our samples.

SiOx/SiO2 mulilayers Si nanocrystal quantum confinement time-resolved photoluminescence
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